Method and circuit arrangement for the self-testing of a...

Details Method and circuit arrangement for the self-testing of a... Method and circuit arrangement for the self-testing of a...

2007-02-27

2007-02-27

Hirshfeld, Andrew H. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S522000, C324S076110, C702S064000

Reexamination Certificate

active

10562075

ABSTRACT:
To provide a method for the self-testing of a reference voltage in electronic components, by means of which method there is defined a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, i.e. for which no external reference-voltage source is required, provision is made for the reference voltage(Uref)to be the variable of a function f(Uref) that has an extreme at the point where the selected nominal value (Uref.test) of the reference voltage (Uref)is situated and, in a self-test, for the values of the function to be determined in succession for the reference voltage (Uref) and for two further test voltages (Uref+ΔUref; Uref−ΔUref) that differ from the reference voltage (Uref) by only small positive and negative amounts (+ΔUref; −ΔUref)respectively and for these values to be compared with one another and, if the values of the function for the test voltages (Uref+ΔUref; Uref−ΔUref) differ from the value of the function for the reference voltage (Uref) in the same direction, for a pass signal to be generated, or if not, for a fail signal to be generated.

REFERENCES:
patent: 3931502 (1976-01-01), Kohlas

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