Method and circuit arrangement for the self-testing of a...

Details Method and circuit arrangement for the self-testing of a... Method and circuit arrangement for the self-testing of a...

2008-07-01

2008-07-01

Dole, Timothy J (Department: 2831)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

Phase comparison

C324S755090, C324S763010

Reexamination Certificate

active

07394239

ABSTRACT:
A method for the self-testing of a reference voltage in electronic components includes a circuit arrangement for a self-test of the reference voltage that can be implemented in the form of an on-chip test, eg., for which no external reference voltage source is required. The reference voltage (Uref) is fed to a voltage-controlled oscillator whose output forms the input to a Wien-Robinson bridge whose output signal is checked in a phase detector for its phase shift relative to the input to the Wien-Robinson bridge to check the balance of the Wien-Robinson bridge. The Wien-Robinson bridge is set to be balanced at a frequency (OMEGAref.test) that is generated in the oscillator at the nominal value(Uref.tes)selected for the reference voltage (Uref), and a pass signal is generated if the bridge is balanced and a fail signal is generated if it is not.

REFERENCES:
patent: 3905557 (1975-09-01), Grommes et al.
patent: 5573099 (1996-11-01), Church et al.
patent: 5773967 (1998-06-01), Tenten

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