Data processing: measuring – calibrating – or testing – Calibration or correction system – Signal frequency or phase correction
Reexamination Certificate
2007-04-10
2007-04-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Signal frequency or phase correction
Reexamination Certificate
active
11161300
ABSTRACT:
A method for determining a target in-phase DC offset compensation value and a target quadrature-phase DC offset compensation value used for compensating DC offset of a database. The method includes: inputting a reference signal into a database which stores a plurality of compensation sets, each having an in-phase DC offset compensation value and a quadrature-phase DC offset compensation value to obtain a plurality of origin offset suppression (OOS) values corresponding to the compensation sets, respectively; and utilizing the compensation sets and the OOS values to compute the target in-phase DC offset compensation value and the target quadrature-phase DC offset compensation value according to an equation set.
REFERENCES:
patent: 4717894 (1988-01-01), Edwards et al.
patent: 6058291 (2000-05-01), Ketcham
patent: 6704551 (2004-03-01), Riou et al.
patent: 2003/0095607 (2003-05-01), Huang et al.
patent: 2004/0150541 (2004-08-01), Itoh
Barlow John
Hsu Winston
Mediatek Inc.
Pretlow Demetrius
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