Method and arrangement of testing device in mobile station

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S733000

Reexamination Certificate

active

10552403

ABSTRACT:
The invention relates to a method and an arrangement of testing a device, such as a peripheral device, in a mobile station. The arrangement comprises a signal generator for generating a test signal for the device under test, a measurement unit integrated into the mobile station for measuring en electric quantity from a feeding line of the device under test, and an analyser for determining an electric response of the device to the test signal by using the electric quantity. According to the invention, at least a portion of the testing procedure composed of generating the test signal and determining the electric response of the device is performed using a functional unit, such as the signal generator or the analyser, integrated into the mobile station.

REFERENCES:
patent: 5481186 (1996-01-01), Heutmaker et al.
patent: 5889837 (1999-03-01), Sands
patent: 6118982 (2000-09-01), Ghisler et al.
patent: 6404293 (2002-06-01), Darabi et al.
patent: 6681354 (2004-01-01), Gupta
patent: 6850081 (2005-02-01), Birdsley et al.
patent: 7000148 (2006-02-01), Kolof et al.
patent: 198 41 470 (2000-04-01), None
patent: 0 525 941 (1993-02-01), None
patent: 0 759 680 (1997-02-01), None
patent: 0 825 734 (1998-02-01), None
patent: 01/63827 (2001-08-01), None
Anthony P. Ambler, Mosha Ben Bassat and Louis Y. Ungar, “Economics of Diagnosis” Autotestcon, 97. 1997 IEEE Autotestcon Proceedings Ahanheim, CA, USA Sep. 22-25, 1997, New York, NY USA, IEEE, pp. 435-445. XP010253057 ISBN: 0-7803-4162-7.
Yervant Zorian, “Built-In-Self-Test”, Microelectronic Engineering, Elsevier Publishers, BV., Amsterdam, NL, vol. 49, No. 1-2, Nov. 1999, pp. 135-138. XP004182057, ISSN: 0167-9317.
Louis Y. Ungar et al., “IEEE-1149.X Standards: Achievements vs. Expectations”, 2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. Autotestcon 2001, Valley Forge, PA, Aug. 20-23, 2001, IEEE Autotestcon Proceedings: IEEE Systems Readiness Technology Conference, New York, NY: IEEE, US. vol. Conf. 97, XP 010556098, ISBN: 0-7803-7094-5.
Yue-Tsang Chen et al.: “Test Waveform Shaping in Mixed Signal Test Bus by Pre-Equalization”, VLAI Test Symposium, 19thIEEE Proceedings on VTS 2001 Apr. 29-May 3, 2001, Piscataway, NJ, USA, IEEE, Apr. 29, 2001, pp. 260-265, XP010542396 ISBN: 0-7695-1122-8.
Lu Y et al.: “Structure and Metrology for a Single-wire Analog Testability Bus”, in Proceedings of the International Test Conference, Washington, Oct. 2-6, 1994, New York, IEEE, US, Oct. 2, 1994, pp. 919-928, XP000520055 ISBN: 0-7803-2103-0.
Gielen et al., “Computer-Aided Design of Analog and Mixed-Signal Integrated Circuits”, Proceedings of the IEEE, vol. 88, No. 12, Dec. 2000, pp. 1825-1852.
Toner et al., “Towards Built-In-Self-Test for SNR Testing of a Mixed-Signal IC”, Proceedings of the International Symposium on circuits and Systems (ISCS), Chicago, May 3-6, 1993, IEEE, US, vol. 2, pp. 1599-1602.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and arrangement of testing device in mobile station does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and arrangement of testing device in mobile station, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and arrangement of testing device in mobile station will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3758233

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.