Method and arrangement for the load testing of a switch for cell

Details Method and arrangement for the load testing of a switch for cell Method and arrangement for the load testing of a switch for cell

1994-04-05

1996-04-02

Beausoliel, Jr., Robert W.

Excavating

371 205, 371 206, 370 15, 370 161, 370 601, 370 8512, 370 8514, G01R 3128

Patent

active

055047548

ABSTRACT:
A switching unit (1) for the switching through of different types of digital data in the asynchronous transfer mode, a so-called ATM-switch, is to be tested whether it is able to overcome a specific load. The installation provides for the feedback (4) from outputs (2) to inputs (3) of baseload cells, which are fed by a generator (5) to an input (35), and constantly circulate because of their routing information. The generator (5) also emits test cells to the input (35). A chooser or discriminator (6) is connected to a measuring output (21) and feeds it back (41) to an input (31). The chooser (6) is able to read, change, copy or suppress certain contents of data cells. It routs the cells back and/or through a second output and an analyzer (7), which evaluates them statistically. Load testing of such a switching unit, whether it can handle a specific load, may cause instabilities in the switch, such as uncontrolled cell loss, congestion, routing errors and the like. The inventive method for load testing the switch has two stages. In a first stage, data cells are supplied to the switch successively and in a controlled manner until a base load near the specified load is reached. In a second stage, the data flow of this base load is altered by rerouting individual cells and superimposing test cells. In this way, any instabilities that occur as a result of overload can immediately be brought under control.

REFERENCES:
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patent: 5299209 (1994-03-01), Murayama et al.
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Method and Arrangement for Testing Switch-Network Components IBM Technical Disclosure Bulletin, Bd. 31, No. 8, Jan. 1989, Armonk, NY, pp. 414-427.

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