Method and arrangement for signal loop test

Details Method and arrangement for signal loop test Method and arrangement for signal loop test

2006-06-27

2006-06-27

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Calibration or correction system

C702S057000, C702S109000, C324S601000, C324S637000

Reexamination Certificate

active

07069165

ABSTRACT:
The invention refers to single-ended test of a loop with the aid of a transceiver, wherein an input impedance (Zin(ƒ)) of the loop is generated. The transceiver has a digital part, a codec and an analog part and is connected to the loop. With the aid of a transmitted and a reflected broadband signal (vin, vout) an echo transfer function Hecho(ƒ)=V(f)out/Vin(f) is generated, which also can be expressed asHecho⁡(f)=H∞⁡(f)⁢Zin⁡(f)+Zh0⁡(f)Zin⁡(f)+Zhyb⁡(f).Here Zh0(ƒ), Zhyb(ƒ) and H∞(ƒ) are model values for the transceiver. In a calibration process a test transceiver, with the same type of hardware as the transceiver, is connected to known impedances, replacing the loop. Hecho(ƒ)=V(f)out/Vin(f) is generated for the known impedances and the model values are generated and are stored in a memory in the transceiver. The stored model values are then used when the input impedance (Zin(ƒ)) for the loop is generated after a measurement of the broadband signal (Vin, vout) is performed.

REFERENCES:
patent: 6538451 (2003-03-01), Galli et al.
patent: 2003/0231023 (2003-12-01), Belge et al.
patent: WO 0124482 (2001-04-01), None
Stefano Galli, et al: IEEE Journal on Selected Areas in Communications vol. 20, No. 5, Jun. 2002 Loop Makeup Identification Via Single Ended Testing: Beyond Mere Loop Qualification Inspec No: 7303048 abstract.

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