Method and arrangement for quantitative potential measurements o

Details Method and arrangement for quantitative potential measurements o Method and arrangement for quantitative potential measurements o

1981-07-27

1983-10-25

Nussbaum, Marvin L.

Wave transmission lines and networks

Coupling networks

Electromechanical filter

310313R, 333150, H03H 964, H03H 900

Patent

active

044121911

ABSTRACT:
For quantitative potential measurement of surface-wave filters, an alternating voltage with amplitude U.sub.E.sbsb.i is connected to an input transducer of the surface-wave filter. At a local region for measurement on the filter, an alternating voltage of amplitude U.sub.P arises. For each such measuring location, the voltage U.sub.P is compared to a nominal value and if it deviates therefrom, this deviation is utilized to control an amplitude of the input voltage U.sub.E.sbsb.i so as to maintain the voltage U.sub.P substantially constant. For the various measurement locations, the changes of the input voltage U.sub.E.sbsb.i are analyzed and a local attenuation factor for each measured region in the filter may be determined. By knowing a frequency of the driving alternating voltage, conclusions can be drawn concerning specific characteristics of the filter.

REFERENCES:
patent: 3689782 (1972-09-01), Epszein
patent: 3886503 (1975-05-01), Bert et al.
patent: 3903486 (1975-09-01), Bert et al.
Fuerbaum et al.--"Visualization of Travelling Surface Acoustic Waves Using a Scanning Electron Microscope", Scanning Electron Microscopy/1980/I, SEM Inc., AMF O'Hare (Chicago), IL 60666, USA; pp. 502-508.
Fuerbaum--"VSLI Testing Using the Electron Probe", Scanning Electron Microscopy/1979/I, SEM Inc., AMF O'Hare, (Chicago), IL 60666, USA; pp. 285-296.
Bert et al.--"Signal Processing by Electron-Beam Interaction with Piezoelectric Surface Waves", IEEE Trans. on Microwave Theory and Techniques, vol. MTT-21, No. 4, Apr. 1973, 255-263.

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