Method and arrangement for positioning a probe card

Details Method and arrangement for positioning a probe card Method and arrangement for positioning a probe card

2008-12-08

2010-06-08

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090, C324S756010

Reexamination Certificate

active

07733108

ABSTRACT:
A method for perpendicular positioning of a probe card relative to a test substrate, includes storing a separation position approached in a first positioning step as a distance between the needle tips of the probe card and the substrate, storing a contact position approached in a second positioning step until the probe card contacts the substrate, and displaying an image of the needle tips. For avoiding erroneous operation after a probe card has been changed, when imaging the needle tips, the stored contact position is imaged and is changed until presentation of this contact position corresponds to actual height of the tips appropriate for the respective probe card and this setting is then stored as a new contact position. A display device presents the needle tips and the stored contact position and is connected to a memory, a recording device and an input device which changes the contact position.

REFERENCES:
patent: 5091692 (1992-02-01), Ohno et al.
patent: 5416592 (1995-05-01), Mori et al.
patent: 6356093 (2002-03-01), Nishikawa et al.

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