Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2007-10-02
2007-10-02
Benson, Walter (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S633000, C073S061440
Reexamination Certificate
active
10527483
ABSTRACT:
The present invention relates to a method and an arrangement of measuring conductive component content of a multiphase fluid flow and uses thereof. The claimed device comprises two coils arranged around the pipe containing the fluid to be measured, where the induced power loss in the mixture is determined, thereby determining the content of the conductive component. Alternatively, a number of coils are arranged on the outside surface of the fluid transporting pipe and the power loss or attenuation of magnetic field is determined.
REFERENCES:
patent: 4458524 (1984-07-01), Meador et al.
patent: 4812739 (1989-03-01), Swanson
patent: 5389883 (1995-02-01), Harper
patent: 6782736 (2004-08-01), Hammer
patent: 196 19 795 (1997-11-01), None
patent: 61204357 (1986-09-01), None
patent: 00/52453 (2000-09-01), None
patent: 01/07874 (2001-02-01), None
patent: 02/079770 (2002-10-01), None
“Development of Electomagnetic Tomography (EMT) for Industrial Applications. Part 1: Sensor Design and Instrumentation” by A.J. Peyton et al; 1stWorld Congress on Industrial Process Tomography, Buxton, Greater Manchester, Apr. 14-17, 1999.
Patent Abstracts of Japan, vol. 11, No. 203, Jul. 2, 1987 & JP 62025246 A (Kawarada Takashi et al) Feb. 3, 1987.
“Magnetic induction tomography” by H. Griffiths; Measurement Science and Technology.12 (2001).
“Process tomography applied to multi-phase flow measurement” by T. Dyakowski; Meas. Sci. Technol. 7 (1996), pp. 343-353.
Benson Walter
Epsis AS
He Amy
LandOfFree
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