X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1996-03-21
1998-07-28
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 57, G01N 2320
Patent
active
057871450
ABSTRACT:
A method and apparatus is provided for identifying crystalline and polycrystalline material in an object placed in an examination region. X-rays having a polychromatic energy distribution are passed through a diaphragm to create a central x-ray beam in a fan plane that is projected into the examination region for irradiating a cross section of the object. The x-rays are diffracted by individual subregions of the object along the cross section in dependence of the presence of crystalline and/or polycrystalline material in the individual subregions. Collimators with collimating windows are arranged beyond the examination region with respect to the diaphragm, each collimating window covering a fixed, predetermined subregion of the examination region and extracting at least one diffracted plane fan beam from the respective individual subregion of the object. Energy spectra of the diffracted x-ray plane fan beams exiting the respective one of the collimating windows are captured with a detector located behind each of the collimating windows for converting the captured energy spectra into signals usable in a data processing arrangement.
REFERENCES:
patent: 4956856 (1990-09-01), Harding
patent: 5007072 (1991-04-01), Jenkins et al.
patent: 5247561 (1993-09-01), Kotowski
patent: 5263075 (1993-11-01), McGann et al.
patent: 5394453 (1995-02-01), Harding
Church Craig E.
Heimann Systems GmbH
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