Method and arrangement for evaluating a defect signal by compari

Details Method and arrangement for evaluating a defect signal by compari Method and arrangement for evaluating a defect signal by compari

1981-04-27

1984-04-24

Strecker, Gerard R.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324240, G01N 2782

Patent

active

044450885

ABSTRACT:
Voltage signals induced in a magnetic probe by stray flux at the location of a defect in a test piece are monitored determining the maximum signal magnitude and maximum signal rise. A quotient of the maximum rise and magnitude is formed and compared with a predetermined threshold value. The sample rate of rise and magnitude is functionally related to the scanning speed thereby providing accuracy independent of the scanning speed.

REFERENCES:
patent: 2925552 (1960-02-01), Cowan et al.
patent: 4117403 (1978-09-01), Forster et al.
patent: 4330748 (1982-05-01), Holden

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