Method and arrangement for detecting short-circuits in circuit b

Details Method and arrangement for detecting short-circuits in circuit b Method and arrangement for detecting short-circuits in circuit b

1993-03-30

1994-09-06

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324500, 324511, 324522, 340650, 361 87, G01R 3102

Patent

active

053451805

ABSTRACT:
According to the present invention, a pulse of short duration is generated from system voltage and is applied to a circuit branch being tested. The resulting current is measured and subjected to a comparative evaluation. The corresponding arrangement has a power semiconductor circuit for generating the testing pulse from the system voltage. Preferably, a so-called GTO (Gate Turn-Off thyristor) is used for this purpose.

REFERENCES:
patent: 3868665 (1975-02-01), Treglown
patent: 4012669 (1977-03-01), Gelfand et al.
patent: 4384248 (1983-05-01), Matsuda et al.
patent: 4535378 (1985-08-01), Endo
patent: 4674021 (1987-06-01), Sachs
patent: 4920447 (1990-04-01), Peppel
patent: 4996625 (1991-02-01), Soma et al.

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