Method and arrangement for analyzing specimens pursuant to the x

Details Method and arrangement for analyzing specimens pursuant to the x Method and arrangement for analyzing specimens pursuant to the x

1989-12-01

1991-12-31

Howell, Janice A.

X-ray or gamma ray systems or devices

Specific application

Fluorescence

378 44, 378 50, G01N 23223

Patent

active

050777661

ABSTRACT:
A method and arrangement for analyzing specimens pursuant to the X-ray fluorescence analysis method utilizing a beam detector to detect a secondary beam that originates from the specimen that is to be analyzed and upon which is directed a primary X-ray beam, the path of which is adjustable in at least one axis of freedom. The surface of a specimen holder on which the specimen is placed is disposed parallel to, and at a defined distance from, a reference plane at which the primary beam is reflected under total reflection conditions. Subsequently, the path of the primary beam is adjusted relative to the reference plane while simultaneously detecting, with a detector, the radiation spectrum of the secondary beam of the specimen. At a predetermined energy level of the primary beam, a secondary beam intensity maximum, to which is assigned a specific reference angle, is determined.

REFERENCES:
patent: 4426717 (1984-01-01), Schwenke et al.
patent: 4785470 (1988-11-01), Wood et al.

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