Method and arrangement for an operational check of a programmabl

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371 25, G06F 1100

Patent

active

045176728

ABSTRACT:
A function check of a programmable logic array is performed in which input lines, product term lines and ground lines are combined into an AND plane and output lines, product term lines and ground lines are combined into an OR plane. The aim is a simple method of function check which permits any potentially-existing fault to be detected. The check is achieved by generating, with a test data generator, bit patterns and applying the same to the input lines, and, through the use of a shift register, successively sensitizing the product term lines either individually or in groups, i.e. disconnecting the same from ground potential. The bit patterns occurring at the output lines are supplied to a test data evaluator. The area of use is in logic circuitry of data processing technology.

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patent: 4216374 (1980-08-01), Lam et al.
patent: 4435805 (1984-03-01), Hsieh et al.
W. W. Wu, Pretesting Laserable PLA Peripheral Circuits, IBM Technical Disclosure Bulletin, vol. 22 #5, p. 1866, 10/79.
A. E. Ruehli, Test Generation Procedures for Delay Testing Dynamic Logic PLA's, IBM Technical Disclosure Bulletin, vol. 21 #5, p. 2097, 10/78.
C. W. Cha, Prime Faults in a Double-Bit Partition PLA, IBM Technical Disclosure Bulletin, vol. 18, No. 8, 1/76, p. 2715.
Williams T. W. et al., "Random Patterns Within a Structured Sequential Logic Design", Digest of Papers, 1977 Semiconductor Test Symposium, pp. 19-27.

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