Optics: measuring and testing – By alignment in lateral direction
Reexamination Certificate
2006-09-19
2006-09-19
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By alignment in lateral direction
Reexamination Certificate
active
07110115
ABSTRACT:
A method and arrangement for aligning an optical component (14) on a printed wiring board (1) by using a reflector (8) below a surface mount technology camera to determine the offset (Δ) between the printed wiring board electrical layout and the light beam in the printed wiring board optical layer.
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Machande Thorsten
Schaller Andreas
Lee Hwa (Andrew)
Motorola Inc.
Stock, Jr. Gordon J.
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