Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-09-13
2005-09-13
Pert, Evan (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C703S017000, C702S117000
Reexamination Certificate
active
06943578
ABSTRACT:
A method, system and apparatus are provided for operating a Picosecond Imaging Circuit Analysis (PICA)/high current source system include applying pulses from a high current pulse source to a Device Under Test (DUT). A photosensor detects photon emissions from the DUT. Signals from the photosensor are used to map photon emissions from the DUT. Data processing means relate the photon emissions to specific features of the DUT.
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Weger et al., “Transmission Line Pulse Picosecond Imaging Circuit Analysis Methodology for Evaluation of ESD and Lacthup”, Mar. 30, 2004, 41st Annual 2003 IEEE International Reliability Physics Symposium Proceedings, pp. 99-104.
Sanda Naoko Pia
Voldman Steven H.
Weger Alan J.
International Business Machines - Corporation
Pert Evan
Schmeiser Olsen & Watts
Steinberg William H.
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