Method and apparatus using re-sampled tie records to...

Details Method and apparatus using re-sampled tie records to... Method and apparatus using re-sampled tie records to...

2004-08-30

2008-12-02

Phu, Phuong (Department: 2611)

Pulse or digital communications

Testing

Phase error or phase jitter

C375S227000, C375S224000, C375S371000, C702S069000

Reexamination Certificate

active

07460591

ABSTRACT:
Measurement of jitter in a system uses a digital test sequence including many repetitions of a test pattern. An Acquisition Record is made of the entire test sequence. A complete Time Interval Error (TIE) Record is made of the Acquisition Record. The complete TIE Record is separated into a collection of Component TIE Records, one for each transition in the test pattern, and that collectively contain all the different instances in the test sequence of that transition in the test pattern. An FFT is performed on each component TIE Record, and the component FFTs are processed to obtain timing jitter data for the digital signal.

REFERENCES:
patent: 5583792 (1996-12-01), Li et al.
patent: 6970528 (2005-11-01), Pearson
patent: 7254168 (2007-08-01), Guenther
patent: 2003/0004664 (2003-01-01), Ward et al.
patent: 2005/0273320 (2005-12-01), Yamaguchi et al.
patent: 2005/0286627 (2005-12-01), Tabatabaei
AN 1432, Jitter Analysis Techniques for High Data Rates, Feb. 3, 2003, 5988-8425EN.
AN 1448-1, Measuring Jitter in Digital Systems, Jun. 1, 2003, 5988-9109EN.
AN 1448-2, Finding Sources of Jitter with Real-Time Jitter Analysis, Jun. 30, 2003, 5988-9740EN.
PN 86100C-1, Precision Jitter Analysis Using the Agilent 86100C DCA-J, Jun. 16, 2004, 5989-1146EN.

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