Method and apparatus using an on-chip ring oscillator for...

Details Method and apparatus using an on-chip ring oscillator for... Method and apparatus using an on-chip ring oscillator for...

2005-05-17

2005-05-17

Flynn, Nathan J. (Department: 2826)

Semiconductor device manufacturing: process

With measuring or testing

C438S017000, C438S018000

Reexamination Certificate

active

06893883

ABSTRACT:
An apparatus and method for identifying integrated circuit chips or dice on a semiconductor wafer. Each chip comprises a ring oscillator having a characteristic oscillating frequency different from the oscillating frequency of the ring oscillators of other chips on the same wafer. Each chip can be associated with various attributes of the wafer on which it was formed and the process steps to which it was subjected using the ring oscillator frequency.

REFERENCES:
patent: 5266890 (1993-11-01), Kumbasar et al.
patent: 5486786 (1996-01-01), Lee
patent: 5686855 (1997-11-01), Lee
patent: 6463570 (2002-10-01), Dunn et al.
patent: 6664799 (2003-12-01), Lovett

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