Method and apparatus using an infrared laser based optical probe

Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

2503418, 324 53, G01R 3128

Patent

active

060721790

ABSTRACT:
A method and an apparatus for detecting an electric field in the active regions of an integrated circuit disposed in a semiconductor. In one embodiment, a laser beam is operated at a wavelength greater than approximately 0.9 .mu.m. The laser beam is focused onto a P-N junction, such as for example the drain of a MOS transistor, through the back side of the semiconductor substrate. As a result of free carrier absorption, the laser beam is partially absorbed near the P-N junction. When a signal is impressed on the P-N junction, the degree of free carrier absorption will be modulated in accordance with the modulation of the depletion region near the P-N junction. The laser beam passes through the P-N junction region, reflects off the oxide interface and metal behind the junction, and returns back through the P-N junction and back out of the silicon surface. Amplitude modulation in this reflected laser beam is detected with an optical detection system.

REFERENCES:
patent: 3976873 (1976-08-01), Bottka et al.
patent: 4144503 (1979-03-01), Itoh et al.
patent: 4273421 (1981-06-01), Gurtler
patent: 4480916 (1984-11-01), Bareket et al.
patent: 4503541 (1985-03-01), Weller et al.
patent: 4583226 (1986-04-01), Liou
patent: 4661770 (1987-04-01), von Roos
patent: 4758092 (1988-07-01), Heinrich et al.
patent: 5097201 (1992-03-01), Henley
patent: 5164664 (1992-11-01), Soelkner
patent: 5872360 (1999-02-01), Paniccia et al.
K.J. Weingarten et al., Picosecond Optical Sampling of GaAs Integrated Circuits, IEEE J Quantum Electronics 24 (2) (1988).
H.K. Heinrich et al., Noninvasive Sheet Charge Density Probe for Integrated Silicon Devices, Appl. Phys. Lett. 48 (16) (1986).
Marvin Chester & Paul H. Wendland, Electroabsorption Spectrum in Silicon, Physical Review Letters 13 (6) (1964).
Bernard Couillaud & Vittorio Fossati-Bellani, Modelocked Lasers and Ultrashort Pulses, Lasers & Applications (1985).
Dr. Hansjoachim Hinkelmann, Scanning Laser Microscopy, reprinted from Semiconductor International, Cahners Publishing Co, (1985).
T. Nagatsuma et al., Electro-Optic Probing Technology for Ultrahigh-Speed IC Diagnosis, IEEE/IMTC (1994).
J. M. Wiesenfeld, Electro-optic Sampling of High-Speed Devices and Integrated Circuits, IBM J. Res. Develop., vol. 34 (2/3) (1990).
H. K. Heinrich, A Noninvasive Optical Probe for Detecting Electrical Signals in Silicon Integrated Circuits (1987). (unpublished Ph.D. dissertation, Stanford University).
H. K. Heinrich et al., Optical Detection of Multibit Logic Signals at Internal Nodes in a Flip-Chip Mounted Silicon Static Random-Access Memory Integrated Circuit, American Vacuum Society, pp. 3109-3111 (1992).
J.I. Pankove, Optical Processes in Semiconductors, Dovers Publications, Inc. (1971).
A. Black et al., Optical Sampling of GHz Charge Density Modulation in Silicon Bipolar Junction Transistors, Electronics Letters 23 (15) (1987).
A.A. Gutken and F.E. Faradzhev, Influence of the Polarization of Light on the Electroabsorption in Silicon, Soviet Physics 6 (9) (1973).
A.A. Gutkin et al., Influence of the Orientation of the Electric Field on the Polarization of Dependence of the Electroabsorption in Silicon, Sov. Phys. Semicond. 8 (6) (1974).
I.A. Merkulov, Polarization Effects in the Electroabsorption in Silicon, Sov. Phys. Semicond. 7 (11) (1974).
A. Frova et al., Electro-Absorption Effects at the Band Edges of Silicon and Germanium, Physical Rev. 145 (2) (1996).
R.A. Soref and B.R. Bennett, Electrooptical Effects in Silicon, IEEE J. Quantum Electron., QE-23 (1) (1987).
H.K. Heinrich et al., Picosecond Backside Optical Detection of Internal Signals in Flip-Chip Mounted Silicon VLSI Circuits, Microelectronic Engineering, 16 (1992).
H.K. Heinrich et al., Measurement of Real-Time Digital Signals in a Silicon Bipolar Junction Transistor Using a Noninvasive Optical Probe, Electronics Letters, 22 (12) (1986).
M. Paniccia, V.R.M. Rao, W.M. Yee, "Optical Probing of Flip Chip Packaged Microprocessors," Submitted for publication in the proceedings of 42 International conference of Electron, Ion and Photon Beam Technology and Nanofabrication, May 26-29, 1998.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus using an infrared laser based optical probe does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus using an infrared laser based optical probe, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus using an infrared laser based optical probe will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2215251

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.