Image analysis – Pattern recognition – Feature extraction
Patent
1996-10-24
1999-08-31
Boudreau, Leo H.
Image analysis
Pattern recognition
Feature extraction
382159, 382181, 382187, 382190, 382209, 382217, 382218, 382221, 382222, 348241, 348246, 348248, G06K 946
Patent
active
059464151
ABSTRACT:
The processing time and memory in converting scanned images to a hardware scription language is significantly reducer by using a "peephole" method to examine only partial images of features of the scanned image that is to be converted. The present method generated minimized feature templates (MFTs) by systematically removing all non-feature image pixels. In particular, the method and apparatus of the present invention establishes pattern estimates from image samples, eliminates unnecessary image pixels using off-line statistical analysis, and extracts feature templates from the larger size image patterns. Pattern recognition is then conducted by processing a few pixels of the unknown image pattern. An application of this technique is to recognize drawing symbols, such as, AND, NAND, OR, NOR, XOR, and XNOR gates, buffers, inverters, registers, and I/O pins from scanned images of electronic drawings.
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Michael Gerald T.
Su Wei
Boudreau Leo H.
Patel Kanji
Tereschuk George B.
The United States of America as represented by the Secretary of
Zelenka Michael
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