Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-08-02
2009-06-09
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
07545161
ABSTRACT:
An on-chip circuit to quantitatively measure threshold voltage shifts of a MOSFET. The circuit includes a programmable Vt reference sensor; a programmable Vt monitoring sensor; and a comparator for receiving inputs from the reference and monitoring sensors providing an output flag signal. The shifting of the MOSFET device voltage threshold monitors process variations, geometry sensitivity, plasma damage, stress, and hot carriers and other device damages. The same circuit also measures voltage differences between any two nodes in an integrated circuit chip or wafer.
REFERENCES:
patent: 4036057 (1977-07-01), Morais
patent: 4326245 (1982-04-01), Saleh
patent: 5307315 (1994-04-01), Oowaki et al.
patent: 5397934 (1995-03-01), Merrill et al.
patent: 5640079 (1997-06-01), Nelson et al.
patent: 5940682 (1999-08-01), Tabara
patent: 5959309 (1999-09-01), Tsui et al.
patent: 5966024 (1999-10-01), Bui et al.
patent: 6143579 (2000-11-01), Chang et al.
patent: 6222395 (2001-04-01), Bertin et al.
patent: 6441680 (2002-08-01), Leung et al.
patent: 6653890 (2003-11-01), Ono et al.
patent: 6771116 (2004-08-01), Wang et al.
patent: 6937052 (2005-08-01), Tam
patent: 6965247 (2005-11-01), Nadal Guardia
patent: 7248124 (2007-07-01), McCorquodale et al.
patent: 7332953 (2008-02-01), Pineda De Gyvez et al.
patent: 2004/0261713 (2004-12-01), Kim et al.
patent: 2005/0057220 (2005-03-01), Miwa et al.
Guo Jong-Ru
Hsu Louis
Wang Ping-Chuan
Yang Zhijian
International Business Machines - Corporation
Isla Rodas Richard
Nguyen Ha Tran T
Schnurmann H. Daniel
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