Method and apparatus to make a semiconductor chip...

Details Method and apparatus to make a semiconductor chip... Method and apparatus to make a semiconductor chip...

2005-06-21

2005-06-21

Flynn, Nathan J. (Department: 2826)

Active solid-state devices (e.g., transistors, solid-state diode

Responsive to non-electrical signal

Electromagnetic or particle radiation

C257S427000, C257S431000, C257S314000

Reexamination Certificate

active

06909159

ABSTRACT:
Methods and apparatus are provided for reducing the overall radiation hardness of a semiconductor chip. A radiation detector and a failure memory are provided. A disable signal or signals is produced by the failure memory. The disable signal is a required input to a user logic function, such as an off chip driver, an off chip receiver, a clock, or a static random access memory. When the radiation detector detects radiation, that detection is stored in the failure memory. The disable signal, when active, causes some or all of the user function to be inoperative. This invention is particularly important when the semiconductor chip is produced in a silicon on insulator (SOI) Complementary Metal Oxide Semiconductor (CMOS) process, which is naturally radiation resistant.

REFERENCES:
patent: 5067106 (1991-11-01), Pedersen et al.
patent: 5736930 (1998-04-01), Cappels

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