Image analysis – Applications – Manufacturing or product inspection
Patent
1995-08-31
1998-11-10
Chang, Jon
Image analysis
Applications
Manufacturing or product inspection
382150, 382174, 382291, G06K 920
Patent
active
058356223
ABSTRACT:
A method and apparatus for locating and measuring capillary indentation marks on wire bonded leads by creating a normalized, one-dimensional circumferential projection of a candidate center location in an image of a capillary indentation mark and detecting signals in the one-dimensional circumferential projection that correspond to a predefined pattern. The one-dimensional circumferential projection can be generated and evaluated for a full or a sub-sampled set of candidate center locations according to a number of different methods.
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Koljonen Juha
Petry, III John P.
Chang Jon
Cognex Corporation
Stretch Maureen
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