Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-04-12
2005-04-12
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C374S117000, C331S057000
Reexamination Certificate
active
06879928
ABSTRACT:
The present invention provides an integrated circuit VLSI temperature system for the calibration of threshold temperatures. A temperature sensitive ring oscillator (TSRO) generates a TSRO calibration parameter. A memory is employable to store the TSRO calibration parameter. A module is employable to determine a threshold TSRO oscillation frequency from the TSRO calibration parameter. A memory is employable for storing at least one threshold TSRO oscillation frequency.
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Lopez-Buedo et al., “Thermal Testing on Programmable Logic Device”, Jun. 1998, Circuits and System, 1998, vol. 2, pp. 240-243.*
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Clabes Joachim Gerhard
Floyd Michael Stephen
Powell, Jr. Lawrence Joseph
Sinharoy Balaram
Stasiak Daniel Lawrence
Baran Mary Catherine
Carr LLP
Carwell Robert M.
Hoff Marc S.
International Business Machines - Corporation
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