Method and apparatus to determine integrated circuit...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S762010, C324S1540PB

Reexamination Certificate

active

06903559

ABSTRACT:
A system may include a first diode and a device coupled to the first diode. The device may be adapted to transmit a first current through the first diode, to determine a first voltage across the first diode, the first voltage associated with the first current, to transmit a second current through the first diode, and to determine a second voltage across the first diode, the second voltage associated with the second current. The device may be further adapted to transmit a third current through the first diode, to determine a third voltage across the first diode, the third voltage associated with the third current, and to determine a temperature of the first diode based at least in part on the first voltage, the second voltage and the third voltage.

REFERENCES:
patent: 6679628 (2004-01-01), Breinlinger
Maxim Integrated Products, “Remote/Local Temperature Sensor with SMBus Serial Interface”, Max1617, 19-1265, Rev. 1, Mar. 1998. 20pgs.
Analog Devices, “dBCOOL™ Remote Thermal Controller and Voltage Monitor”, ADM1027, Rev. A. 56pgs., 2003 no month available.

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