Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2005-06-07
2005-06-07
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S762010, C324S1540PB
Reexamination Certificate
active
06903559
ABSTRACT:
A system may include a first diode and a device coupled to the first diode. The device may be adapted to transmit a first current through the first diode, to determine a first voltage across the first diode, the first voltage associated with the first current, to transmit a second current through the first diode, and to determine a second voltage across the first diode, the second voltage associated with the second current. The device may be further adapted to transmit a third current through the first diode, to determine a third voltage across the first diode, the third voltage associated with the third current, and to determine a temperature of the first diode based at least in part on the first voltage, the second voltage and the third voltage.
REFERENCES:
patent: 6679628 (2004-01-01), Breinlinger
Maxim Integrated Products, “Remote/Local Temperature Sensor with SMBus Serial Interface”, Max1617, 19-1265, Rev. 1, Mar. 1998. 20pgs.
Analog Devices, “dBCOOL™ Remote Thermal Controller and Voltage Monitor”, ADM1027, Rev. A. 56pgs., 2003 no month available.
Buckley Maschoff & Talwalkar LLC
Nguyen Vincent Q.
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