Method and apparatus to determine a measurement of optical...

Optics: measuring and testing – By light interference

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S477000, C356S483000, C356S073100

Reexamination Certificate

active

06317214

ABSTRACT:

FIELD OF INVENTION
The present invention relates to optical systems and more particularly, to a method and apparatus for measuring multiple path interference attributable devices used in such systems.
BACKGROUND OF THE INVENTION
An optical system may use an optical fibre as a communication medium and light as an information carrier. For instance, an optical signal may be a beam of light modulated to represent binary information.
Optical signals may be employed in digital communication systems that exchange information as a series of binary digits called “bits”. The reception of binary information is primarily concerned with the correct recognition of the value of a bit. Communication quality may be measured in terms of a bit error rate, a ratio of incorrectly recognized bits to correctly recognized bits.
Due to practical limits to the length of optical fibre, a continuous fibre may not reach from a sender to a receiver. As well, attenuation reduces the amplitude of an optical signal over a distance. To maintain an effective signal level, an optical communication link between a sender and a receiver may be broken into smaller individual links, called spans. To maintain a strong signal, an amplifier may be installed where each span is connected to a subsequent span.
The connection between the amplifier and the optical fibre may not be perfect. As a result, a small amount of the incident optical signal may reflect away from the destination end of a span rather than transmitting. Part of the reflected signal may then be reflected away from the source end of the span and may appear as a component of the original signal when received at the destination end. The detection of ones and zeroes of the original signal is made difficult by the combination of the original signal with the twice reflected interfering signal, referred to as multiple path interference (MPI). This increased detection difficulty elevates the bit error rate. Reflections may also be introduced in optical systems due to imperfections in individual devices such as the amplifiers, isolators, filters, optical switches, components within amplifiers, etc. Accordingly, methods and devices used to assess the effects of optical devices on MPI are known.
Mathematical predictions of the effect of MPI on an optical system often test the predictions using systems in which a controlled amount of MPI is introduced. In Gimlett and Cheung, “Performance Implications of Component Crosstalk in Transparent Lightwave Networks,” (1994),
J. Lightwave Technology,
vol. 7, pp.888-895, a power penalty is derived dependent on a reflection coefficient that is representative the of amount of MPI relative to the original signal. In Goldstein et al., “Effects of Phase-to-Intensity Noise Conversion by Multiple Reflections on Gigabit-per-Second DFB Laser Transmission Systems,” (1989),
IEEE Photonics Technology Letters,
vol. 6, pp.657-660., a power penalty is approximated dependent on a ratio of crosstalk (MPI) to signal power at a receiver. In both of the above, the power penalty is the increase in power necessary to obtain an error rate equivalent to the error rate in the absence of MPI.
U.S. Pat. No. 5,617,200 issued Apr. 1, 1997 to Vance describes a method for measuring the secondary path intensity of an optical device. The method includes applying a pulse of light to a first end of the device and detecting the light exiting from the second end of the device. The exiting light is analyzed in the time domain to determine a primary pulse intensity and a secondary pulse intensity. The ratio of the secondary pulse intensity to the primary pulse intensity provides a measure of the device's secondary path intensity.
The above methods however, do not take into account real in-field conditions to which a device may be subject. Specifically, in-field reflected optical signals may be present at both inputs and outputs of the device, that may be further reflected by the device.
Moreover, the measurement of a power penalty due to MPI may not be as indicative of the quality of the device as a measurement of the magnitude of MPI attributable to the device.
Finally, a measurement of MPI in the frequency domain may be preferable to an average of measurements of MPI made in the time domain.
The present invention accordingly attempts to address some of the shortcomings of known ways to measure MPI.
SUMMARY OF THE INVENTION
The present invention permits improved measurement of the magnitude of multiple path interference attributable to an optical device under test. An optical signal including a primary signal component (E
1
) and a reflected signal component (E
2
), preferably emanating from the device, are used to form an electrical signal, having a product signal component. The product signal component includes an electrical signal component representative of a product (E
1
×E
2
) of the primary signal component and the reflected signal component. A measurement of the magnitude of the power of the product signal component is determined and combined with a measurement of the power of the optical signal. The power measurements are used to determine an indicator of the magnitude of multiple path interference.
In accordance with an aspect of the present invention there is also provided an apparatus used to measure the amount of multiple path interference attributable to a device under test, in in-field like conditions. The apparatus includes at least one reflector that is in optical communication with an output port of the device under test, and reflects optical signals to produce an output optical signal, at the output of the device that has a reflected signal component. This simulates reflected signals that might be introduced by other optical component in communication with the device in in-field conditions. In the test apparatus, a measuring device, measures the magnitude of multiple path interference in the resulting output optical signal. The apparatus may also include another reflector, in optical communication with an input port of the device, and used to produce an optical signal having a reflected signal component at the input port.
Other aspects and features of the present invention will become apparent to those of ordinary skill in the art upon review of the following description of specific embodiments of the invention in conjunction with the accompanying figures.


REFERENCES:
patent: 5291267 (1994-03-01), Sorin et al.
patent: 5617200 (1997-04-01), Vance

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus to determine a measurement of optical... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus to determine a measurement of optical..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus to determine a measurement of optical... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2575407

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.