X-ray or gamma ray systems or devices – Accessory – Alignment
Reexamination Certificate
2005-08-18
2009-02-10
Kiknadze, Irakli (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Alignment
C378S207000
Reexamination Certificate
active
07488107
ABSTRACT:
Certain embodiments of the present invention provide an improved system and method for detecting an alignment error in an imaging system. The method includes projecting a calibration pattern from a source onto a detector to generate calibration image data, and analyzing the calibration image data to determine a positional shift in the detector with respect to the source. The calibration pattern is generated by the imaging system using a calibration pattern generator, such as collimator or pattern insert, and the calibration pattern provides information regarding a position of the detector with respect to the source. An error may be reported if the calibration image data does not match the reference image data. An offset may be extracted based on a difference between the calibration image data and the reference image data to correct the positional shift. The offset may be automatically applied to imaging calculations from the imaging system.
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Dellapenna Michael A.
General Electric Company
Kiknadze Irakli
McAndrews Held & Malloy Ltd.
Vogel Peter J.
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