Oscillators – With frequency calibration or testing
Reexamination Certificate
2008-01-01
2008-01-01
Lee, Benny (Department: 2817)
Oscillators
With frequency calibration or testing
C331S010000, C331S025000, C331S03600C, C331S00100A, C331S17700V, C327S157000
Reexamination Certificate
active
07315218
ABSTRACT:
A circuit and method are provided for calibrating an analog oscillator in the digital domain. The circuit and method disclosed herein centers an oscillation frequency of an analog oscillator by producing a binary signal to which the analog oscillator is responsive. Changes in the binary digital signal cause the oscillation frequency of the analog oscillator to shift in a desired direction to calibrate the analog oscillator. At the completion of the calibration process, the control of the oscillation frequency of the analog oscillator is switched to the analog domain so that the analog oscillator is responsive to an analog control voltage to shift the oscillation frequency.
REFERENCES:
patent: 6545545 (2003-04-01), Fernandez-Texon
patent: 2001/0020875 (2001-09-01), Jansson
patent: 2002/0075080 (2002-06-01), Nelson et al.
patent: 2002/0167362 (2002-11-01), Justice et al.
patent: 2005/0258906 (2005-11-01), Su et al.
Chapin IP Law LLC
Chapin, Esq. Barry W.
Johnson Ryan J
Lee Benny
Sun Microsystems Inc.
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