Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-06-20
2006-06-20
Nghiem, Michael (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07065458
ABSTRACT:
A system includes a plurality of digital storage oscilloscopes (DSOs) in which each DSO requires a respective temporal portion of a signal under test (SUT) according to a synchronized triggering signal and respective post-trigger count periods such that a plurality of acquisition records may be concatenated to produce a longer acquisition record.
REFERENCES:
patent: 6832174 (2004-12-01), Tran et al.
patent: 2002/0147943 (2002-10-01), Slaugh et al.
patent: 2003/0231187 (2003-12-01), Dobyns et al.
patent: 2004/0008160 (2004-01-01), Etheridge et al.
patent: 2004/0013176 (2004-01-01), Gerlach et al.
patent: 2004/0124848 (2004-07-01), Tran et al.
U.S. Appl. No. 60/387,154, Dobyns et al., Jun. 2002.
Blegen Douglas A.
Kelly David L.
Tran Que Thuy
Gray Francis I.
Lenihan Thomas F.
Moser Patterson & Sheridan LLP
Tektronix Inc.
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