Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2004-03-04
2008-03-04
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S099000
Reexamination Certificate
active
07340366
ABSTRACT:
A method and apparatus of temperature compensation for an integrated circuit using on-chip circuits, sensors, and an algorithm. The chip includes an on-chip reference circuit, an on-chip sensor measuring a parameter relative to the reference, and an on-chip computation means for processing an algorithm. A supplemental off-chip reference circuit is also used. The algorithm carries out the following steps: (A) performing a first calibration of an internal reference residing in an integrated circuit system on-chip at a first (higher) temperature at a first testing site, and (B) utilizing calibration data obtained at the step (A) to perform a second calibration of the internal reference source residing on the integrated system on-chip at a second (lower) temperature at a second testing site.
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MAX6325/MAX6341/MAX6350 voltage reference, MAXIM Integrated Products, Apr. 1997, 12 pages.
Aas Arne
Gangstø Gunnar
Atmel Corporation
Charioui Mohamed
Raymond Edward
Schneck Thomas
Schneck & Schneck
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