Method and apparatus of simulating semiconductor circuit

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364488, G06F 1750

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active

058869069

ABSTRACT:
A simulation apparatus for simulating a characteristic of a semiconductor circuit, including; a distribution information input unit for receiving a distribution information, the distribution information including a range and/or profile of distribution of a variation of a device parameter and/or a process parameter of the semiconductor circuit and being adaptive to an actual distribution; a random number generating unit for generating a random number on the basis of a probability responsive to the received distribution information; a characteristic calculation unit for calculating a dominant formula by using the random number to obtain a characteristic of the semiconductor circuit; and an output unit for outputting the resultant characteristic of the semiconductor circuit.

REFERENCES:
patent: 5301118 (1994-04-01), Heck et al.
patent: 5481485 (1996-01-01), Takeuchi
patent: 5627772 (1997-05-01), Sonoda et al.
patent: 5655110 (1997-08-01), Krivokapic et al.
patent: 5719796 (1998-02-01), Chen

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