Data processing: measuring – calibrating – or testing – Measurement system in a specific environment
Reexamination Certificate
2005-03-07
2009-06-09
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
C702S066000
Reexamination Certificate
active
07546208
ABSTRACT:
A method and apparatus is disclosed for signal spectrometry using an improved apodization function. Such method and apparatus involve (i) obtaining sample and reference time domain waveforms; (ii) applying sample and reference apodization waveforms to the sample and reference time domain waveforms, such that substantially same weight is applied to corresponding substantially coextensive regions of the sample and reference time domain waveforms, (iii) transforming the sample and reference apodized waveforms from the time domain into the frequency domain; and (iv) generating referenced spectral analysis waveform for signal analysis from a ratio of the transformed sample and reference frequency spectra, the spectral analysis waveform substantially excluding frequencies associated with the corresponding substantially coextensive regions of the apodized sample and reference time domain waveforms.
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Bosch-Charpenay Sylvie
Kamlet Leonard I.
Marran David F.
Marshik-Geurts Barbara J.
Neira Jorge E.
Bui Bryan
MKS Instruments Inc.
Proskauer Rose LLP
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