Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1987-01-08
1988-08-23
Willis, Davis L.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902
Patent
active
047657383
ABSTRACT:
In method and apparatus of measuring frequency response in an optical receiving system, a laser light source produces a frequency-modulated laser light which is divided into the first and second lights. The first light is delayed through a longer optical path than that of the second light by a predetermined time, and thereafter the delayed first light and the second light or the original laser light are combined to produce combined light. The frequency response is measured in accordance with output power of beat signal converted from the combined light in regard to frequency of the beat signal.
REFERENCES:
Kawanishi et al, "Measurement of High Frequency Response of Long Wavelength Optical Detector . . . ", National Conf. Record, 1985, Semiconductor Devices and Materials, Inst. of Electronics and Communication Engineers of Japan, Nov. 1985, pp. 1-191.
Kobayashi et al, "Direct Frequency Modulation in AlGaAs Semiconductor Lasers", IEEE Journal of Quantum Electronics, vol. QE-18, No. 14, Apr. 1982, pp. 582, 595.
Kawasaki et al, "Biconical-Taper Single-Mode Fiber Coupler", Optics Letters, vol. 6, No. 7, Jul. 1981, pp. 327-328.
Fujita et al, "Single-Mode Fiber Coupler for Optical Heterodyne Detection", National Conf. Record, 1984, Inst. of Electronics and Communication Engineers of Japan, Mar. 1984, p. 1059.
Koren Matthew W.
NEC Corporation
Willis Davis L.
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