Method and apparatus involving pulsed electron beam processing o

Metal treatment – Compositions – Heat treating

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357 91, H01L 21263

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active

039501876

ABSTRACT:
A pulsed electron beam generator produces a short duration pulse of electrons in the form of a directed beam for thermal processing of a semiconductor device, which is positioned in a pulsed electron beam chamber so that the propagating electron beam impacts upon the device surface in selected regions of the device that are to be processed. Energy deposited by the impacting electron pulse momentarily elevates the temperature of the selected regions above threshold processing temperatures for rapid, effective annealing, sintering or other thermal processing. The characteristics of the electron beam pulse are such that only those surface vicinity regions to be processed are elevated to a high temperature, the remaining mass of the semiconductor device not being subjected to unnecessary or undesirable high temperature exposure.

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patent: 3533857 (1970-10-01), Mayer et al.
patent: 3737346 (1973-06-01), Godfrey
patent: 3796929 (1974-03-01), Nicholas et al.

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