Method and apparatus for writing an erasable non-volatile memory

Static information storage and retrieval – Floating gate – Particular biasing

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36518529, 365218, G11C 1606, G11C 1604, G11C 700

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active

060757272

ABSTRACT:
A method for writing to a bit of a non-volatile memory (50) by alternately applying programming and erase voltages to a control gate wordline of a memory cell. A write includes programming and erasing bits (30, 31, . . . , 32, 33) in the memory array (56). Upon completion of the write operation a verify erase (VE) indication and a verify program (VP) indication are provided to a memory controller (58), which then determines if multiple cycles are necessary. The configuration of the memory cell allows isolation of each bit in the memory array to avoid effects of writes to neighbor bits. According to one embodiment, a three transistor EEPROM is written by providing a high voltage to the drain select of the selected wordline, while providing a low voltage to the drain select of other wordlines. Programming and erase voltages are applied to the control gate wordline of the selected wordline in cycles until the write is complete.

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Nozoe et al., "A 256-Mb Multilevel Flash Memory with 2-MB/s Program Rate for Mass Storage Applications," IEEE, pp. 1544-1550 (1999).

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