Method and apparatus for visually time-correlating waveform...

Details Method and apparatus for visually time-correlating waveform... Method and apparatus for visually time-correlating waveform...

2005-07-12

2005-07-12

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S068000, C702S187000

Reexamination Certificate

active

06917889

ABSTRACT:
A test and measurement instrument acquires a signal from a device under test, displays that signal as a source waveform, and makes measurements on that source waveform with regard to a predetermined property or event. The test and measurement instrument employs the method of the subject invention for placing these measurements into a waveform and directly correlating a position in the measurement waveform to the same area on the source waveform where they were measured. Specifically, the subject invention displays the correlation of points on a source waveform and a measurement waveform without requiring the use of a common horizontal time scale. In one embodiment of the invention, the measurement waveform is a histogram and a pointer to a given location in the histogram causes identification of corresponding areas in the source waveform.

REFERENCES:
patent: 6195617 (2001-02-01), Miller
patent: 6311138 (2001-10-01), Miller
patent: 2003/0229473 (2003-12-01), Gomes et al.
U.S. Appl. No. 60/346,091, filed Dec. 31, 2001.
Tektronix Products Catalog, Copyright 1991, Signal Conditioners, New TVC 501; p. 235.
Tektronix Test and Measurement Products Catalog, Copyright 1993, Signal Conditioners TVC 501, AM 503S, AM 503A, A6302; p. 350.

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