Method and apparatus for vibration detection, method and...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Mechanical measurement system

Reexamination Certificate

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C702S150000

Reexamination Certificate

active

10941019

ABSTRACT:
A method is provided for determining information relating to vibration. The method includes projecting an aerial image at an image position in a projection plane; mapping an intensity of the aerial image into an image map that contains values of coordinates of sampling locations and of the intensity sampled at each sampling location; and measuring intensity of the aerial image received through a slot pattern. The method may also include determining from the image map a detection position of a slope portion of the image map; at the detection position of the slope portion, measuring a temporal intensity of the aerial image and relative positions of the slot pattern and the image position; and determining from the temporal intensity of the aerial image information relating to vibration for the aerial image. The relative positions of the slot can be measured as position-related data of the slot pattern.

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European Search Report issued for European Patent Application No. 05108492.9-1226, dated Feb. 22, 2007.
Kazuya Ota, et al., “New Alignment Sensors for Wafer Stepper,” Proceedings of SPIE Optical/Laser Microlithography, vol. 1463, 1991, pp. 304-314.

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