Optics: measuring and testing – By polarized light examination
Patent
1995-11-22
1999-09-21
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
356368, 128633, 128665, G01J 400
Patent
active
059561440
ABSTRACT:
A device and method for determining the identity and concentration of constituent compounds of a test specimen. The device and method are based upon the polarization effect that a specimen will have when subjected to randomly polarized light. This polarization effect will cause the intensity of light wither reflecting from or passing through the test specimen at one angle of polarization to be different then the intensity of light exiting the specimen at a second angle of polarization at a specific wavelength. The intensity of light either reflecting from or exiting the test specimen various planes of polarization is accurately measured by irradiating the specimen with randomly polarized light and then polarizing the light reflected from or passing through the specimen in different planes of polarization angles and measuring the intensity of light in each of these polarization planes at one or more wavelengths of light. These measurements will yield a unique pattern determined by the ratio of intensity of light either reflected or passing through the specimen per degree of polarization per wavelength.
REFERENCES:
patent: 3724952 (1973-04-01), Vossberg
patent: 4011014 (1977-03-01), Tanton
patent: 4901728 (1990-02-01), Hutchinson
patent: 5009230 (1991-04-01), Hutchinson
patent: 5209231 (1993-05-01), Cote et al.
Cernosek John
Kaplan Milton R.
Henry David G.
Micro Research, Inc.
Pham Hoa Q.
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