Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1997-12-31
1999-12-21
Assouad, Patrick
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
327 83, G01K 100
Patent
active
060061693
ABSTRACT:
An integrated circuit has circuitry formed by a fabrication process. The circuitry has an electrical characteristic that is different from a predetermined value due to variations in the fabrication process. The electrical characteristic is responsive to a level of a current, and a current source of the integrated circuit is configured to be selectably enabled to adjust the level of the current to move the electrical characteristic closer to the predetermined value.
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Burton Edward A.
Pippin Jack D.
Sandhu Bal S.
Assouad Patrick
Intel Corporation
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