Method and apparatus for trimming an integrated circuit

Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system

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327 83, G01K 100

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active

060061693

ABSTRACT:
An integrated circuit has circuitry formed by a fabrication process. The circuitry has an electrical characteristic that is different from a predetermined value due to variations in the fabrication process. The electrical characteristic is responsive to a level of a current, and a current source of the integrated circuit is configured to be selectably enabled to adjust the level of the current to move the electrical characteristic closer to the predetermined value.

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