Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1993-07-09
1994-08-09
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324627, 324631, 342165, 342 4, 343703, G01S 740
Patent
active
053370163
ABSTRACT:
A method and apparatus for traveling wave attenuation measurement in the UHF and VHF frequency bands. The test set up comprises a ramp structure located in the quiet zone of a parallel plate set up. The RAM specimen to be tested is attached to the top ramp surface starting at the highest point of the ramp. The time domain signal is gated to reject all scattering except the contribution from the ramp surface. The inverse Fourier transform of the gated time data results in the frequency response of the ramp. The RCS from ramp with RAM material attached is normalized to that of the perfectly conducting surface to provide a relative attenuation of the surface traveling wave.
REFERENCES:
patent: 3136946 (1964-06-01), Levine
patent: 3815019 (1974-06-01), Wiles
patent: 4520308 (1985-05-01), Rohde
patent: 4634963 (1987-01-01), Lunden
patent: 4739249 (1988-04-01), Nyfors
patent: 5229726 (1993-07-01), Kent
Newstrom Charles A.
Tran Hung B.
Tulyathan Pravit
Wozniak Sam
Ginsberg Lawrence N.
Rockwell International Corporation
Silberberg Charles T.
Solis Jose M.
Wieder Kenneth A.
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