Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-11-27
1992-09-01
Harvey, Jack B.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
379 26, 34087038, H04B 346
Patent
active
051442523
ABSTRACT:
A method and arrangement for measuring the resistance of a transducer which is coupled across a pair of conductors that are each coupled through separate sets of blocking diodes to a line card, these conductors possibly carrying a variable voltage. In the method and arrangement, a voltage of a first one of the conductors to ground is iteratively measured. This voltage from the first conductor to ground is tracked such that current flow is allowed through only one of the sets of blocking diodes. A value of the resistance of the transducer can then be accurately determined from the iteratively measured voltage values, since the variable voltage is taken into account by the tracking of the voltage from the first conductor to ground.
REFERENCES:
patent: 3922490 (1975-11-01), Pettis
patent: 4025736 (1977-03-01), Chlupsa
patent: 4041382 (1977-08-01), Washburn
patent: 4399333 (1983-08-01), Gewitz et al.
patent: 4728881 (1988-03-01), Evans et al.
patent: 4852145 (1989-07-01), Bevers et al.
patent: 5073920 (1991-12-01), Masukawa et al.
Siu Edward K.
Walsworth Richard L.
Harris Corporation
Harvey Jack B.
Regan Maura K.
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