Chemistry: electrical and wave energy – Apparatus – Electrolytic
Patent
1992-04-07
1994-03-08
Niebling, John
Chemistry: electrical and wave energy
Apparatus
Electrolytic
204412, 204413, G01N 2726
Patent
active
052924238
ABSTRACT:
Disclosed are a method and apparatus for trace metal testing using mercury-coated screen printed electrodes. Both voltammetric and potentiometric stripping analysis are used. Sample solutions were tested employing both stirring and non-stirring, as well as aeration and deaeration procedures. Microliter samples suitable for slide mounting were also employed.
REFERENCES:
patent: 3855099 (1974-12-01), Matson
patent: 4003705 (1977-01-01), Buzza et al.
patent: 4090926 (1978-05-01), Matson
patent: 4545382 (1985-10-01), Higgins et al.
patent: 4661210 (1987-04-01), Tenygl
patent: 4695555 (1987-09-01), O'Keeffe
patent: 4786373 (1988-11-01), Saloheimo et al.
patent: 4804443 (1989-02-01), Newman et al.
patent: 4865992 (1989-09-01), Hach et al.
patent: 5019515 (1991-05-01), Gisin et al.
patent: 5120421 (1992-06-01), Glass et al.
patent: 5131999 (1992-07-01), Gunasingham
J. Electroanal Chem. 12(1966)269-276, S. P. Perrone and K. K. Davenport.
Stewart, "Flow Injection Analysis-New Tool for Old Assays-New Approach to Analytical Measurements" Analytical Chemistry, vol. 55, No. 9 (Aug. 1983).
Wang, "Anodic Stripping Voltammetry as an Analytical Tool" Environ. Sci. Technol., vol. 16, No. 2 (1982).
Hilditch, "Disposable Electrochemical Biosensors" Analyst, vol. 116 (Dec. 1991).
Oakton.RTM. ElectraScan.RTM., EC-1 Series sales brochure (Feb. 1991).
Wang, "Anodic Stripping Voltammetry-An Instrumental Analysis Experiment" Chem. Education, vol. 60, p. 1074 (Dec. 1983).
Green, "Disposable Single-Use Sensors" Analytical Proc., vol. 28 (Nov. 1991).
Wang, "Mercury=Coated Carbon-Foam Composite Electrodes for Stripping Analysis of Trace Metals" Amer. Chem Soc., vol. 64,(1992).
Baker Rod D.
Bell Bruce F.
Duggan Donovan F.
New Mexico State University Technology Transfer Corp.
Niebling John
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