Method and apparatus for time-of-flight mass spectrometry

Details Method and apparatus for time-of-flight mass spectrometry Method and apparatus for time-of-flight mass spectrometry

2011-03-22

2011-03-22

Souw, Bernard E (Department: 2881)

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

C250S286000, C250S281000, C315S503000

Reexamination Certificate

active

07910879

ABSTRACT:
A method and apparatus for time-of-flight (TOF) mass spectrometry. The apparatus improves the ion focusing properties in an orthogonal direction and permits connection with an orthogonal-acceleration ion source for improvement of sensitivity. The apparatus comprises an ion source for emitting ions in a pulsed manner, an analyzer for realizing a helical trajectory, and a detector for detecting the ions. The analyzer is composed of plural laminated toroidal electric fields to realize the helical trajectory.

REFERENCES:
patent: 6828553 (2004-12-01), Weiss
patent: 6949738 (2005-09-01), Yamaguchi et al.
patent: 7186972 (2007-03-01), Farnsworth
patent: 7196324 (2007-03-01), Verentchikov
patent: 7482583 (2009-01-01), Ueno
patent: 7504620 (2009-03-01), Sato et al.
patent: 2005/0087684 (2005-04-01), Farnsworth
patent: 2005/0285030 (2005-12-01), Farnsworth
patent: 11-195398 (1999-07-01), None
patent: 2000-243345 (2000-09-01), None
patent: 2003-086129 (2003-03-01), None
Daisuke Okumura et al., “A Simple Multi-Turn Time of Flight Mass Spectrometer ‘MULTUM II’,” J. Mass. Spectrom. Soc. Jpn., vol. 51, No. (No. 2) 2003, pp. 349-353.

Affiliated with

Also associated with

Rating

Method and apparatus for time-of-flight mass spectrometry does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for time-of-flight mass spectrometry, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for time-of-flight mass spectrometry will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2714166