Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1990-01-22
1992-02-18
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356380, 25022728, G01B 1124, H01J 516
Patent
active
050888285
ABSTRACT:
Testing techniques for three-dimensional testing of printed circuit boards overcome the disadvantages that presently exist such as, for example, too little height resolution, low processing speed and difficult manipulation. The testing in the microscopic domain occurs within unaltering, displaceable evaluation windows on the basis of the calculation of cross-sectional areas at each scan point on a printed circuit board. Microscopic testing occurs on the basis of the calculation of defined, simple geometric values within a scan field and by following comparisons to reference values. The arrangement for the implementation of the methods utilize a laser scanner for triangulation, an evaluation unit, and at least one high-resolution, position-sensitive detector.
REFERENCES:
patent: 3612888 (1971-10-01), Boucher
patent: 3771873 (1973-11-01), Tourret
patent: 3906220 (1975-09-01), Delingat
patent: 4343553 (1982-08-01), Nakagawa et al.
patent: 4900146 (1990-02-01), Penney et al.
"Technische Optik", Walter de Gruyter, Berlin, New York, 1974, pp. 52-57, Dr. Hermann Slevogi.
Doemens Guenter
Schneider Richard
Pham Hoa
Rosenberger Richard A.
Siemens Aktiengesellschaft
LandOfFree
Method and apparatus for three-dimensional testing of printed ci does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for three-dimensional testing of printed ci, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for three-dimensional testing of printed ci will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1818702