Method and apparatus for three-dimensional optical measurement o

Details Method and apparatus for three-dimensional optical measurement o Method and apparatus for three-dimensional optical measurement o

1992-07-30

1994-04-26

Johnston, Jill A.

Optics: measuring and testing

By polarized light examination

With light attenuation

250237G, G01B 1124

Patent

active

053071514

ABSTRACT:
A single projector is used to project a grating pattern on the surface of the object being measured, and the grating pattern is recorded simultaneously by two cameras from two different directions relative to the direction of projection. Both cameras record images of the same object areas. The fringe phases of the image patterns recorded by each of the two cameras are computed separately; and the object coordinates, which are computed from the combination of the computed fringe phases of both cameras, are unambiguous within a large measured range.

REFERENCES:
patent: 4488172 (1984-12-01), Hutchin
patent: 4641972 (1987-02-01), Halioua et al.
patent: 4937445 (1990-06-01), Leong et al.
patent: 5175601 (1992-12-01), Fitts
"Scanning moire method and automatic measurement of 3-D shapes", by M. Idesawa et al., Applied Optics, vol. 16, No. 8, Aug. 1977, pp. 2152-2162.
"Interferometric phase measurement using spatial synchronous detection", by K. H. Womack, Optical Engineering, Jul./Aug. 1984, vol. 23, No. 4, pp. 391-395.
"Three dimensional inspection using multistripe structured light", by J. A. Jalkio et al., Optical Engineering, Nov./Dec. 1985, vol. 24, No. 6, pp. 966-974.

Affiliated with

Also associated with

Rating

Method and apparatus for three-dimensional optical measurement o does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for three-dimensional optical measurement o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for three-dimensional optical measurement o will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1715302