Method and apparatus for three-dimensional measurement

Details Method and apparatus for three-dimensional measurement Method and apparatus for three-dimensional measurement

2006-12-21

2009-02-10

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Orientation or position

Reexamination Certificate

active

07490019

ABSTRACT:
A three-dimensional measurement method for conducting measurement of a three-dimensional shape of a surface of an object using a three-dimensional measuring device is provided. The method includes providing, in advance, a posture sensor that detects a posture of the three-dimensional measuring device, providing, in advance, a parameter table in which a parameter corresponding to a posture of the three-dimensional measuring device is stored, and calculating three-dimensional shape data of the object using measurement data and the parameter, the measurement data being obtained by conducting measurement of the object with the three-dimensional measuring device and the parameter being read out from the parameter table according to a posture of the three-dimensional measuring device upon the measurement.

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patent: 2002/0150288 (2002-10-01), Fujiwara
patent: 2003/0007680 (2003-01-01), Iijima et al.
patent: 3447430 (2003-07-01), None

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