Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2005-07-05
2005-07-05
Mehta, Bhavesh M. (Department: 2625)
Image analysis
Applications
Manufacturing or product inspection
C382S154000, C348S131000, C356S237100, C702S153000
Reexamination Certificate
active
06915007
ABSTRACT:
A three dimensional inspection method for inspecting ball array devices having a plurality of balls, where the ball array device is positioned in an optical system. The inspection method includes the steps of illuminating at least one ball on the ball array device, and disposing a sensor, a first optical element and a second optical element in relation to the ball array device so that the sensor obtains at least two differing views of the at least one ball, the sensor providing an output representing the at least two differing views. The output is processed using a triangulation method to calculate a three dimensional position of the at least one ball with reference to a pre-calculated calibration plane.
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Beaty Elwin M.
Mork David P.
Beaty Elaine E.
Beaty Elwin M.
Chawan Sheela
Mehta Bhavesh M.
Roberts Abokhair & Mardula LLC
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