Method and apparatus for three dimensional inspection of...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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C382S151000, C348S087000, C250S559230

Reexamination Certificate

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06915006

ABSTRACT:
A three dimensional inspection system for inspecting ball array devices having a plurality of balls, where the ball array device is positioned in an optical system. An illuminator is located to illuminate at least one ball on the ball array device. A first optical element is positioned to transmit light to the sensor. A second optical element is positioned to direct light from the at least one ball to the sensor, where the sensor, the first optical element and the second optical element cooperate to obtain at least two differing views of the at least one ball, the sensor providing an output representing the at least two differing views. A processor is coupled to receive the output, where the processor processes the output by using a triangulation method to calculate a three dimensional position of the at least one ball with reference to a pre-calculated calibration plane.

REFERENCES:
patent: 5245671 (1993-09-01), Kobayashi et al.
patent: 5440391 (1995-08-01), Smeyers
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5859924 (1999-01-01), Liu et al.
patent: 5909285 (1999-06-01), Beaty
patent: 6055054 (2000-04-01), Beaty
patent: 6055055 (2000-04-01), Toh
patent: 6064756 (2000-05-01), Beaty
patent: 6064757 (2000-05-01), Beaty
patent: 6072898 (2000-06-01), Beaty
patent: 6096567 (2000-08-01), Kaplan et al.
patent: 6118540 (2000-09-01), Roy et al.
patent: 6141040 (2000-10-01), Toh
patent: 6236747 (2001-05-01), King et al.
Shenghua Ye et al. “Vision -based system calibration for dimensional inspection”. Nov. 9, 1992, IEEE, pp. 731-734 , vol. 2.
John Lau, Ball Grid Array Technology, pp. 558, 561, 565, 591 (1995 McGraw-Hill).

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