Method and apparatus for three dimensional inspection of...

Image analysis – Applications – Manufacturing or product inspection

Reexamination Certificate

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Details

C382S151000, C348S135000, C356S237100, C702S153000

Reexamination Certificate

active

06862365

ABSTRACT:
An apparatus for three dimensional inspection of an electronic part which has a camera and illuminator for imaging a first view of the electronic part. An optical element is positioned to reflect a different view of the electronic part into the camera, and the camera thus provides an image of the electronic part having differing views of the electronic part. An image processor applies calculations on the differing views to calculate a three dimensional position of at least one portion of the electronic part.

REFERENCES:
patent: 4521807 (1985-06-01), Werson
patent: 4638471 (1987-01-01), van Rosmalen
patent: 4677473 (1987-06-01), Okamoto et al.
patent: 4731855 (1988-03-01), Suda et al.
patent: 4825394 (1989-04-01), Beamish et al.
patent: 4886958 (1989-12-01), Merryman et al.
patent: 4893183 (1990-01-01), Nayar
patent: 4943722 (1990-07-01), Breton et al.
patent: 5058178 (1991-10-01), Ray
patent: 5095447 (1992-03-01), Manns et al.
patent: 5113581 (1992-05-01), Hidese
patent: 5133601 (1992-07-01), Cohen et al.
patent: 5140643 (1992-08-01), Izumi et al.
patent: 5173796 (1992-12-01), Palm et al.
patent: 5204734 (1993-04-01), Cohen et al.
patent: 5245671 (1993-09-01), Kobayashi et al.
patent: 5276546 (1994-01-01), Palm et al.
patent: 5307149 (1994-04-01), Palm et al.
patent: 5345391 (1994-09-01), Hull et al.
patent: 5355221 (1994-10-01), Cohen et al.
patent: 5420689 (1995-05-01), Siu
patent: 5420691 (1995-05-01), Kawaguchi
patent: 5430548 (1995-07-01), Hiroi et al.
patent: 5452080 (1995-09-01), Tomiya
patent: 5465152 (1995-11-01), Bilodeau et al.
patent: 5546189 (1996-08-01), Svetkoff et al.
patent: 5550763 (1996-08-01), Michael et al.
patent: 5563702 (1996-10-01), Emery et al.
patent: 5563703 (1996-10-01), Lebeau et al.
patent: 5574668 (1996-11-01), Beaty
patent: 5574801 (1996-11-01), Collet-Beillon
patent: 5581632 (1996-12-01), Koljonen
patent: 5592562 (1997-01-01), Rooks
patent: 5600150 (1997-02-01), Stern et al.
patent: 5617209 (1997-04-01), Svetkoff et al.
patent: 5621530 (1997-04-01), Marrable, Jr.
patent: 5648853 (1997-07-01), Stern et al.
patent: 5652658 (1997-07-01), Jackson et al.
patent: 5654800 (1997-08-01), Svetkoff et al.
patent: 5692070 (1997-11-01), Kobayashi
patent: 5694482 (1997-12-01), Maali et al.
patent: 5734475 (1998-03-01), Pai
patent: 5761337 (1998-06-01), Nishimura et al.
patent: 5801966 (1998-09-01), Ohashi
patent: 5812268 (1998-09-01), Jackson et al.
patent: 5812269 (1998-09-01), Svetkoff et al.
patent: 5815275 (1998-09-01), Svetkoff et al.
patent: 5818061 (1998-10-01), Stern et al.
patent: 5828449 (1998-10-01), King et al.
patent: 5859698 (1999-01-01), Chau et al.
patent: 5859924 (1999-01-01), Liu et al.
patent: 5870489 (1999-02-01), Yamazaki et al.
patent: 5943125 (1999-08-01), King et al.
patent: 6005965 (1999-12-01), Tsuda et al.
patent: 6055054 (2000-04-01), Beaty et al.
patent: 6055055 (2000-04-01), Toh
patent: 6064759 (2000-05-01), Buckley et al.
patent: 6072898 (2000-06-01), Beaty et al.
patent: 6096567 (2000-08-01), Kaplan et al.
patent: 6141040 (2000-10-01), Toh
patent: 6236747 (2001-05-01), King et al.
patent: 6307210 (2001-10-01), Suzuki et al.
patent: WO 9112489 (1991-08-01), None
patent: WO 9207250 (1992-04-01), None
CI-8250, The Complete High-Speed Inspection System, ICOS' Products, 6 pages.
John Lau, Ball Grid Array Technology, pp. 558, 561, 565, 591 (1995 McGraw-Hill).

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