Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-03-18
2000-04-11
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356372, 356235, G01B 2122
Patent
active
060493844
ABSTRACT:
An apparatus for three dimensional imaging using multi-phased structured light. Measurement of dimensions as small as two hundred microns within one percent accuracy is possible, and multiple scans of a target object, such as the solder pads on an electronic circuit board substrate, are not required. A light source, having a pair of synchronized lamps and a specially designed reticle, projects two different phases of structured light onto a target object. The two phases are projected nearly instantaneously, and the detector is able to discriminate between the two exposures presented by the two out of phase illuminations. The method for presenting the three dimensional image uses filtering techniques and certain assumptions to resolve intensity equations having three unknowns from the two exposures of out of phase structured light.
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Fishbaine David
Haugen Paul R.
Kranz David M.
Rudd Eric P.
CyberOptics Corporation
Font Frank G.
Ratliff R. A.
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